"A single built-in sensor to check pull-up and pull-down CMOS networks ..."

Rodrigo Possamai Bastos et al. (2013)

> Home

Details and statistics

DOI: 10.1109/PATMOS.2013.6662169

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/patmos/BastosTDFNR13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/patmos/BastosTDFNR13
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS 2013: 157-163

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.