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"On improving the stuck-at fault coverage of functional test sequences by ..."

Irith Pomeranz, Sudhakar M. Reddy (2001)

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DOI: 10.1109/TEST.2001.966636

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  persistent URL:
  - https://dblp.org/rec/conf/itc/PomeranzR01a
Irith Pomeranz, Sudhakar M. Reddy:
On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. ITC 2001: 211-220

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