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"Digital oscillation-test method for delay and stuck-at fault testing of ..."

Karim Arabi et al. (1998)

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DOI: 10.1109/TEST.1998.743141

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/ArabiIDK98
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  persistent URL:
  - https://dblp.org/rec/conf/itc/ArabiIDK98
Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100

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