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"A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist ..."

Taejoong Song et al. (2018)

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DOI: 10.1109/ISSCC.2018.8310252

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-14

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  dblp key:
  - conf/isscc/SongJRKKPDPCJKC18
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  - https://dblp.org/rec/conf/isscc/SongJRKKPDPCJKC18
Taejoong Song, Jonghoon Jung, Woojin Rim, Hoonki Kim, Yongho Kim, Changnam Park, Jeongho Do, Sunghyun Park, Sungwee Cho, Hyuntaek Jung, Bongjae Kwon, Hyun-Su Choi, Jaeseung Choi, Jong Shik Yoon:
A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications. ISSCC 2018: 198-200

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