"Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient ..."

Swarup Bhunia et al. (2005)

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DOI: 10.1109/ISQED.2005.96

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Kaushik Roy:
Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning. ISQED 2005: 453-458

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