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"From Device Aging Physics to Automated Circuit Reliability Sign Off."

Christian Schlünder et al. (2019)

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DOI: 10.1109/IRPS.2019.8720457

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/irps/SchlunderWRLRUG19
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  - https://dblp.org/rec/conf/irps/SchlunderWRLRUG19
Christian Schlünder, Katja Waschneck, Peter Rotter, Susanne Lachenmann, Hans Reisinger, Franz Ungar, Georg Georgakos:
From Device Aging Physics to Automated Circuit Reliability Sign Off. IRPS 2019: 1-12

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