"An Improved Markov Source Design for Scan BIST."

Chaowen Yu et al. (2003)

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DOI: 10.1109/OLT.2003.1214375

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Chaowen Yu, Wei Li, Sudhakar M. Reddy, Irith Pomeranz:
An Improved Markov Source Design for Scan BIST. IOLTS 2003: 106-110

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