"Storage Based Built-In Test Pattern Generation Method for ..."

Irith Pomeranz (2020)

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DOI: 10.1109/IOLTS50870.2020.9159705

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-10

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Irith Pomeranz:
Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests. IOLTS 2020: 1-4

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