"Don't-Care Identification on Specific Bits of Test Patterns."

Kohei Miyase et al. (2002)

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DOI: 10.1109/ICCD.2002.1106769

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy:
Don't-Care Identification on Specific Bits of Test Patterns. ICCD 2002: 194-199

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