"Improving the Proportion of At-Speed Tests in Scan BIST."

Yu Huang et al. (2000)

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DOI: 10.1109/ICCAD.2000.896514

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yu Huang, Irith Pomeranz, Sudhakar M. Reddy, Janusz Rajski:
Improving the Proportion of At-Speed Tests in Scan BIST. ICCAD 2000: 459-463

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