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"Scan chain encryption for the test, diagnosis and debug of secure circuits."
Mathieu Da Silva et al. (2017)
- Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo:
Scan chain encryption for the test, diagnosis and debug of secure circuits. ETS 2017: 1-6
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