"Low cost concurrent test implementation for linear digital systems."

Ismet Bayraktaroglu, Alex Orailoglu (2000)

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DOI: 10.1109/ETW.2000.873791

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Ismet Bayraktaroglu, Alex Orailoglu:
Low cost concurrent test implementation for linear digital systems. ETW 2000: 140-143

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