"Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan ..."

Fan Yang et al. (2008)

> Home

Details and statistics

DOI: 10.1109/DFT.2008.11

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/YangCDRP08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/YangCDRP08
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. DFT 2008: 394-402

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.