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"Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels."
Abdelaziz Ammari et al. (2003)
- Abdelaziz Ammari, Régis Leveugle, Matteo Sonza Reorda
, Massimo Violante:
Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels. DFT 2003: 336-343
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