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"Test time reduction in analogue/mixed-signal devices by defect oriented ..."
Hamidreza Hashempour et al. (2011)
- Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing:
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE 2011: 371-376
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