"On the generation of scan-based test sets with reachable states for ..."

Irith Pomeranz (2004)

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DOI: 10.1145/996566.996813

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Irith Pomeranz:
On the generation of scan-based test sets with reachable states for testing under functional operation conditions. DAC 2004: 928-933

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