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"Hot carrier reliability in ultra-scaled sige channel p-FinFETs."

Miaomiao Wang et al. (2017)

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DOI: 10.1109/ASICON.2017.8252563

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-28

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  dblp key:
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Miaomiao Wang, Xin Miao, James H. Stathis, Richard G. Southwick:
Hot carrier reliability in ultra-scaled sige channel p-FinFETs. ASICON 2017: 666-669

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