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Hideki Murakami
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2010 – 2019
- 2019
- [c1]Hideki Murakami, Yoshiki Tanaka, Jun-ichi Yamashita, Rikako Takeshita, Yasunori Sakane, Takumi Okamoto, Tetsushi Koide:
Development of In-situ Monitoring System for Crop Growth Observation. ISDCS 2019: 1-4 - 2013
- [j11]Kuniaki Hashimoto, Akio Ohta, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Control of Interfacial Reaction of HfO2/Ge Structure by Insertion of Ta Oxide Layer. IEICE Trans. Electron. 96-C(5): 674-679 (2013) - [j10]Akio Ohta, Katsunori Makihara, Mitsuhisa Ikeda, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Evaluation of Chemical Composition and Bonding Features of Pt/SiOx/Pt MIM Diodes and Its Impact on Resistance Switching Behavior. IEICE Trans. Electron. 96-C(5): 702-707 (2013) - 2012
- [j9]Akio Ohta, Yuta Goto, Shingo Nishigaki, Guobin Wei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering. IEICE Trans. Electron. 95-C(5): 879-884 (2012) - 2011
- [j8]Guobin Wei, Yuta Goto, Akio Ohta, Katsunori Makihara, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Impact of Annealing Ambience on Resistive Switching in Pt/TiO2/Pt Structure. IEICE Trans. Electron. 94-C(5): 699-704 (2011) - [j7]Akio Ohta, Daisuke Kanme, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Mg Diffusion into HfO2/SiO2/Si(100) Stacked Structures and Its Impact on Detect State Densities. IEICE Trans. Electron. 94-C(5): 717-723 (2011) - 2010
- [j6]Hideki Murakami, Tim S. Yoon, Emad S. Attallah-Wasif, Chaiwat Kraiwattanapong, Ichiro Kikkawa, William C. Hutton:
Quantitative differences in intervertebral disc-matrix composition with age-related degeneration. Medical Biol. Eng. Comput. 48(5): 469-474 (2010)
2000 – 2009
- 2007
- [j5]Yanli Pei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki, Seiji Inumiya, Yasuo Nara:
Evaluation of Dielectric Reliability of Ultrathin HfSiOxNy in Metal-Gate Capacitors. IEICE Trans. Electron. 90-C(5): 962-967 (2007) - 2005
- [j4]Hideki Murakami, Wataru Mizubayashi, Hirokazu Yokoi, Atsushi Suyama, Seiichi Miyazaki:
Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation. IEICE Trans. Electron. 88-C(4): 640-645 (2005) - [j3]Hideki Murakami, Yoshikazu Moriwaki, Masafumi Fujitake, Daisuke Azuma, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate. IEICE Trans. Electron. 88-C(4): 646-650 (2005) - [j2]Katsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique. IEICE Trans. Electron. 88-C(4): 705-708 (2005) - [j1]Taku Shibaguchi, Mitsuhisa Ikeda, Hideki Murakami, Seiichi Miyazaki:
Charging and Discharging Characteristics of Stacked Floating Gates of Silicon Quantum Dots. IEICE Trans. Electron. 88-C(4): 709-712 (2005)
Coauthor Index
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