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Journal Articles
- 2015
[j3]Loic Welter, J. L. Scotto di Quaquero, Philippe Dreux, Laurent Lopez, Hassen Aziza, Jean-Michel Portal:
Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectron. Reliab. 55(9-10): 1328-1333 (2015)- 2011
- [j2]Y. Joly, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, Franck Julien, Pascal Fornara:
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectron. Reliab. 51(9-11): 1561-1563 (2011) - 2007
- [j1]Claire Le Roux, Laurent Lopez, Abdellatif Firiti, Jean-Luc Ogier, Frédéric Lalande, Romain Laffont, Gilles Micolau:
A new method to quantify retention-failed cells of an EEPROM CAST. Microelectron. Reliab. 47(9-11): 1609-1613 (2007)
Conference and Workshop Papers
- 2015
- [c6]Jordan Innocenti, Franck Julien, Jean-Michel Portal, Laurent Lopez, Q. Hubert, Pascal Masson, Jacques Sonzogni, Stephan Niel, Arnaud Régnier:
Layout optimizations to decrease internal power and area in digital CMOS standard cells. MIPRO 2015: 1582-1587 - [c5]Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan:
Dynamic current reduction of CMOS digital circuits through design and process optimization. PATMOS 2015: 77-81 - 2014
- [c4]Jordan Innocenti, Loic Welter, Franck Julien, Laurent Lopez, Jacques Sonzogni, Stephan Niel, Arnaud Régnier, Emmanuel Paire, Karen Labory, Eric Denis, Jean-Michel Portal, Pascal Masson:
Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology. MWSCAS 2014: 897-900 - 2013
- [c3]Benjamin Rebuffat, Vincenzo Della Marca, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Olivier Paulet, Laurent Lopez, Romain Laffont:
Effect of ions presence in the SiOCH inter metal dielectric structure. ESSDERC 2013: 218-221 - 2011
- [c2]Y. Joly, L. Truphemus, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Franck Julien, Pascal Fornara:
Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. ISCAS 2011: 2549-2552 - 2005
- [c1]Laurent Lopez, Jean-Michel Portal, Didier Née:
A New Embedded Measurement Structure for eDRAM Capacitor. DATE 2005: 462-463
Informal and Other Publications
- 2007
- [i1]Laurent Lopez, Jean-Michel Portal, Didier Née:
A New Embedded Measurement Structure for eDRAM Capacitor. CoRR abs/0710.4736 (2007)
Coauthor Index
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