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J. L. Scotto di Quaquero

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2015
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Loic Welter, J. L. Scotto di Quaquero, Philippe Dreux, Laurent Lopez, Hassen Aziza, Jean-Michel Portal:
Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Microelectron. Reliab. 55(9-10): 1328-1333 (2015)

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