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N. Bicaïs-Lépinay

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Journal Articles

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2006
[j2]
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S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon:
Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectron. Reliab. 46(9-11): 1530-1535 (2006)
2002
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N. Bicaïs-Lépinay, F. André, R. Pantel, S. Jullian, Alain Margain, L. F. Tz. Kwakman:
Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis. Microelectron. Reliab. 42(9-11): 1747-1752 (2002)

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