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Soo Young Lee
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2020 – today
- 2023
- [j7]Soo Young Lee, Choon-Su Park, Keonhyeok Park, Hyung Jin Lee, Seungchul Lee:
A Physics-informed and data-driven deep learning approach for wave propagation and its scattering characteristics. Eng. Comput. 39(4): 2609-2625 (2023) - 2022
- [j6]Soo Young Lee, Jiho Chang, Seungchul Lee:
Deep Learning-Enabled High-Resolution and Fast Sound Source Localization in Spherical Microphone Array System. IEEE Trans. Instrum. Meas. 71: 1-12 (2022) - 2021
- [j5]Gyuwon Kim, Soo Young Lee, Jong-Seok Oh, Seungchul Lee:
Deep Learning-Based Estimation of the Unknown Road Profile and State Variables for the Vehicle Suspension System. IEEE Access 9: 13878-13890 (2021) - 2020
- [j4]Soo Young Lee, Bayu Adhi Tama, Changyun Choi, Jong-Yeon Hwang, Jonggeun Bang, Seungchul Lee:
Spatial and Sequential Deep Learning Approach for Predicting Temperature Distribution in a Steel-Making Continuous Casting Process. IEEE Access 8: 21953-21965 (2020) - [j3]Kyung Ho Sun, Hyunsuk Huh, Bayu Adhi Tama, Soo Young Lee, Joon Ha Jung, Seungchul Lee:
Vision-Based Fault Diagnostics Using Explainable Deep Learning With Class Activation Maps. IEEE Access 8: 129169-129179 (2020)
2000 – 2009
- 2009
- [c4]Woonsuk Suh, Soo Young Lee, Eunseok Lee:
Performance Improvement of Fault Tolerant CORBA Based Intelligent Transportation Systems (ITS) with an Autonomous Agent. NGITS 2009: 133-145
1990 – 1999
- 1995
- [j2]Soo Young Lee, Kewal K. Saluja:
Test application time reduction for sequential circuits with scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(9): 1128-1140 (1995) - 1994
- [c3]Soo Young Lee, Kewal K. Saluja:
Sequential test generation with reduced test clocks for partial scan designs. VTS 1994: 220-225 - 1993
- [j1]Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee:
An Efficient Algorithm for Sequential Circuit Test Generation. IEEE Trans. Computers 42(11): 1361-1371 (1993) - [c2]Soo Young Lee, Kewal K. Saluja:
Efficient Test Vectors for ISCAS Sequential Benchmark Circuits. ISCAS 1993: 1511-1514 - 1992
- [c1]Soo Young Lee, Kewal K. Saluja:
An algorithm to reduce test application time in full scan designs. ICCAD 1992: 17-20
Coauthor Index
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