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"An Efficient Algorithm for Sequential Circuit Test Generation."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee (1993)

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DOI: 10.1109/12.247839

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/KelseySL93
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  persistent URL:
  - https://dblp.org/rec/journals/tc/KelseySL93
Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee:
An Efficient Algorithm for Sequential Circuit Test Generation. IEEE Trans. Computers 42(11): 1361-1371 (1993)

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