"An algorithm to reduce test application time in full scan designs."

Soo Young Lee, Kewal K. Saluja (1992)

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DOI: 10.1109/ICCAD.1992.279405

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Soo Young Lee, Kewal K. Saluja:
An algorithm to reduce test application time in full scan designs. ICCAD 1992: 17-20

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