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Jong Duk Lee
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Journal Articles
- 2009
- [j11]Seongjae Cho, Jung Hoon Lee, Gil Sung Lee, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Design Consideration for Vertical Nonvolatile Memory Device Regarding Gate-Induced Barrier Lowering (GIBL). IEICE Trans. Electron. 92-C(5): 620-626 (2009) - [j10]Jongwook Jeon, Ickhyun Song, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin:
Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design. IEICE Trans. Electron. 92-C(5): 627-634 (2009) - [j9]Sang Hyuk Park, Sangwoo Kang, Seongjae Cho, Dong-Seup Lee, Jung Han Lee, Hong-Seon Yang, Kwon-Chil Kang, Joung-Eob Lee, Jong Duk Lee, Byung-Gook Park:
Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for Room Temperature Operation. IEICE Trans. Electron. 92-C(5): 647-652 (2009) - [j8]Yoon Kim, Seongjae Cho, Gil Sung Lee, Il-Han Park, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
3-Dimensional Terraced NAND (3D TNAND) Flash Memory-Stacked Version of Folded NAND Array. IEICE Trans. Electron. 92-C(5): 653-658 (2009) - [j7]Doo-Hyun Kim, Il-Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Trans. Electron. 92-C(5): 659-663 (2009) - 2008
- [j6]Seongjae Cho, Il-Han Park, Jung Hoon Lee, Jang-Gn Yun, Doo-Hyun Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI). IEICE Trans. Electron. 91-C(5): 731-735 (2008) - [j5]Jang-Gn Yun, Il-Han Park, Seongjae Cho, Jung Hoon Lee, Doo-Hyun Kim, Gil Sung Lee, Yoon Kim, Jong Duk Lee, Byung-Gook Park:
Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme. IEICE Trans. Electron. 91-C(5): 742-746 (2008) - 2007
- [j4]Jong Pil Kim, Woo Young Choi, Jae Young Song, Seongjae Cho, Sang Wan Kim, Jong Duk Lee, Byung-Gook Park:
Design and Simulation of Asymmetric MOSFETs. IEICE Trans. Electron. 90-C(5): 978-982 (2007) - [j3]Seongjae Cho, Jang-Gn Yun, Il-Han Park, Jung Hoon Lee, Jong Pil Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices. IEICE Trans. Electron. 90-C(5): 988-993 (2007) - 2004
- [j2]Yong-Jin Yoon, Hyuck In Kwon, Jong Duk Lee, Byung Gook Park, Nam-Seog Kim, Uk-Rae Cho, Hyun-Geun Byun:
Synchronous mirror delay for multiphase locking. IEEE J. Solid State Circuits 39(1): 150-156 (2004) - [j1]Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee:
Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectron. Reliab. 44(1): 47-51 (2004)
Conference and Workshop Papers
- 2003
- [c2]Woo Young Choi, Jong Duk Lee, Byung-Gook Park:
Reverse-order source/drain formation with double offset spacer (RODOS) for CMOS low-power, high-speed and low-noise amplifiers. ISLPED 2003: 189-192 - [c1]Ki-Whan Song, Sang-Hoon Lee, Dae Hwan Kim, Kyung Rok Kim, Jaewoo Kyung, Gwanghyeon Baek, Chun-An Lee, Jong Duk Lee, Byung-Gook Park:
Complementary Self-Biased Scheme for the Robust Design of CMOS/SET Hybrid Multi-Valued Logic. ISMVL 2003: 267-272
Coauthor Index
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