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"Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit ..."

Doo-Hyun Kim et al. (2009)

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DOI: 10.1587/TRANSELE.E92.C.659

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/KimPCLSP09
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/KimPCLSP09
Doo-Hyun Kim, Il-Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Trans. Electron. 92-C(5): 659-663 (2009)

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