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Wei-Ting Kary Chien

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Journal Articles

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2019
[j12]
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  - journals/tr/ChienCK19
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Wei-Ting Kary Chien, Andrew Chung, Way Kuo:
Fast Semiconductor Reliability Assessments Using SPRT. IEEE Trans. Reliab. 68(2): 526-538 (2019)
2018
[j11]
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Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Zhijuan Wang:
Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies. Microelectron. Reliab. 81: 368-372 (2018)
2017
[j10]
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  - journals/mr/ZhaoC17
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Xiangfu Zhao, Wei-Ting Kary Chien:
Exploration of baking temperature effects on 28 nm BEOL reliability. Microelectron. Reliab. 72: 1-4 (2017)
2016
[j9]
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  - journals/mr/ChienZZS16
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Wei-Ting Kary Chien, Atman Yong Zhao, Yueqin Zhu, Yongliang Song:
Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests. Microelectron. Reliab. 64: 185-188 (2016)
[j8]
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Wei-Ting Kary Chien, Yueqin Zhu, Yongliang Song, Atman Yong Zhao:
Influence of I/O oxide process on the NBTI performance of 28 nm HfO₂-based HKMG p-MOSFETs. Microelectron. Reliab. 64: 220-224 (2016)
2015
[j7]
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  - journals/tr/YangC15
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Siyuan Frank Yang, Wei-Ting Kary Chien:
Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index. IEEE Trans. Reliab. 64(4): 1158-1163 (2015)
2012
[j6]
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  - journals/tr/ChienL12
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Wei-Ting Kary Chien, Ming Li:
Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs. IEEE Trans. Reliab. 61(4): 837-845 (2012)
2010
[j5]
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  - journals/tr/ChienY10
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Wei-Ting Kary Chien, Siyuan Frank Yang:
A Practical, Innovative Method for Electro-Static Discharge Data Analysis. IEEE Trans. Reliab. 59(2): 440-446 (2010)
2007
[j4]
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  - journals/tr/ChienY07
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Wei-Ting Kary Chien, Siyuan Frank Yang:
A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. IEEE Trans. Reliab. 56(1): 69-76 (2007)
2004
[j3]
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  - journals/mr/TsengCGWC04
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Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai:
Some practical considerations for effective and efficient wafer-level reliability control. Microelectron. Reliab. 44(8): 1233-1243 (2004)
2003
[j2]
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  - journals/mr/TsengCC03
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Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai:
Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectron. Reliab. 43(5): 713-724 (2003)
[j1]
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  - journals/tim/TsengCGC03
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Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai:
A cost-effective wafer-level reliability test system for integrated circuit makers. IEEE Trans. Instrum. Meas. 52(5): 1458-1467 (2003)

Conference and Workshop Papers

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What is the meaning of the colors in the publication lists?

2015
[c5]
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  - conf/ieem/GaoZYCC15
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Hailin Jonson Gao, Xueliang Ruben Zhang, Yanju Lisa Yu, Kaiyuan Kevin Chang, Wei-Ting Kary Chien:
The investigation of semiconductor shipping bag reliability. IEEM 2015: 935-938
[c4]
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  - conf/ieem/JinHQCZ15
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Morn Jin, Wenwen He, John Qiao, Wei-Ting Kary Chien, Shirley Zhao:
Wafer level package wafer probing shift error-proof quality control. IEEM 2015: 939-942
[c3]
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  - conf/ieem/QiaoJHCZ15
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John Qiao, Morn Jin, Wenwen He, Wei-Ting Kary Chien, Shirley Zhao:
Comprehensive Wafer Level Package Die Processing Service quality control enhancement. IEEM 2015: 1684-1688
[c2]
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  - conf/irps/ChienZZC15
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Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Flora Cheng:
The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics. IRPS 2015: 2
2014
[c1]
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  - conf/ieem/GongYCZCC14
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Taicheng Kevin Gong, Yanju Lisa Yu, Yan Kaily Cao, Xueliang Ruben Zhang, Kaiyuan Kevin Chang, Wei-Ting Kary Chien:
A study on the optimization of wafer pre-treatment conditions for thin film stability monitor. IEEM 2014: 843-847

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