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Alberto Rodriguez-Fernandez

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Journal Articles

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2018
[j3]
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Alberto Rodriguez-Fernandez, J. Muñoz-Gorriz, Jordi Suñé, Enrique Miranda:
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. Microelectron. Reliab. 88-90: 142-146 (2018)
2017
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Alberto Rodriguez-Fernandez, Carlo Cagli, Luca Perniola, Jordi Suñé, Enrique Miranda:
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis. Microelectron. Reliab. 76-77: 178-183 (2017)
2015
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Alberto Rodriguez-Fernandez, M. B. González, Francesca Campabadal, Jordi Suñé, Enrique Miranda:
Electrical characterization of multiple leakage current paths in HfO₂/Al₂O₃-based nanolaminates. Microelectron. Reliab. 55(9-10): 1442-1445 (2015)

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