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"Electrical characterization of multiple leakage current paths in ..."

Alberto Rodriguez-Fernandez et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.05.018

access: closed

type: Journal Article

metadata version: 2021-09-25

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Alberto Rodriguez-Fernandez, M. B. González, Francesca Campabadal, Jordi Suñé, Enrique Miranda:
Electrical characterization of multiple leakage current paths in HfO₂/Al₂O₃-based nanolaminates. Microelectron. Reliab. 55(9-10): 1442-1445 (2015)

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