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"A new method for estimating the conductive filament temperature in OxRAM ..."
Alberto Rodriguez-Fernandez et al. (2018)
- Alberto Rodriguez-Fernandez
, J. Muñoz-Gorriz, Jordi Suñé
, Enrique Miranda:
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. Microelectron. Reliab. 88-90: 142-146 (2018)
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