"Wafer-Level Test Path Pattern Recognition and Test Characteristics for ..."

Ken Chau-Cheung Cheng et al. (2020)

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DOI: 10.23919/DATE48585.2020.9116546

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen:
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. DATE 2020: 1710-1711

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