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Kunyang Liu
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- affiliation: Waseda University, Shinjuku, Tokyo, Japan
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2020 – today
- 2024
- [j4]Xingyu Wang, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara:
A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement. IEEE Trans. Very Large Scale Integr. Syst. 32(3): 564-572 (2024) - 2023
- [c9]Kunyang Liu, Yichen Tang, Shufan Xu, Ruilin Zhang, Hirofumi Shinohara:
A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response. CICC 2023: 1-2 - [c8]Ruilin Zhang, Haochen Zhang, Xingyu Wang, Ziyang Ye, Kunyang Liu, Hirofumi Shinohara:
Practical Markov Chain and Von Neumann based Post-processing Circuits for True Random Number Generators. MWSCAS 2023: 841-845 - 2022
- [j3]Ruilin Zhang, Xingyu Wang, Kunyang Liu, Hirofumi Shinohara:
A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement. IEEE J. Solid State Circuits 57(8): 2498-2508 (2022) - [c7]Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, Hirofumi Shinohara:
A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance. ESSCIRC 2022: 513-516 - [c6]Xingyu Wang, Ruilin Zhang, Yuxin Wang, Kunyang Liu, Xuanzhen Wang, Hirofumi Shinohara:
A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement. VLSI-DAT 2022: 1-4 - 2021
- [j2]Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara:
A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement. IEEE J. Solid State Circuits 56(7): 2193-2204 (2021) - [c5]Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara:
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In. ISSCC 2021: 502-504 - [c4]Ruilin Zhang, Xingyu Wang, Luying Wang, Xinpeng Chen, Fan Yang, Kunyang Liu, Hirofumi Shinohara:
A 0.186-pJ per Bit Latch-Based True Random Number Generator with Mismatch Compensation and Random Noise Enhancement. VLSI Circuits 2021: 1-2 - 2020
- [j1]Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara:
A 373-F2 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and ${V}_{\text{SS}}$ Bias-Based Dark-Bit Detection. IEEE J. Solid State Circuits 55(6): 1719-1732 (2020) - [c3]Kunyang Liu, Hongliang Pu, Hirofumi Shinohara:
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in. CICC 2020: 1-4 - [c2]Xingyu Wang, Hongjie Liu, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara:
An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit. MWSCAS 2020: 285-288
2010 – 2019
- 2018
- [c1]Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara:
A 373 F2 2D Power-Gated EE SRAM Physically Unclonable Function With Dark-Bit Detection Technique. A-SSCC 2018: 161-164
Coauthor Index
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