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P. Mialhe

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Journal Articles

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2008
[j5]
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R. Habchi, C. Salame, R. El Bitar, P. Mialhe:
Switching times variation of MOSFET devices with temperature and high-field stress. Microelectron. J. 39(5): 828-831 (2008)
[j4]
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W. Tazibt, P. Mialhe, J. P. Charles, M. A. Belkhir:
A junction characterization for microelectronic devices quality and reliability. Microelectron. Reliab. 48(3): 348-353 (2008)
2007
[j3]
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  - journals/mj/BoukhatemTMAKM07
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M. H. Boukhatem, M. El Tahchi, G. W. El Haj Moussa, M. Ajaka, A. Khoury, P. Mialhe:
Carriers temperature for an operating silicon p-n junction. Microelectron. J. 38(4-5): 615-619 (2007)
[j2]
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R. Habchi, C. Salame, P. Mialhe, A. Khoury:
Switching times variation of power MOSFET devices after electrical stress. Microelectron. Reliab. 47(8): 1296-1299 (2007)
2005
[j1]
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M. El Tahchi, E. Nassar, P. Mialhe:
Study and development of a silicon infrared diode operating under forward bias. Microelectron. J. 36(3-6): 260-263 (2005)

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