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ORCIDRami F. Salem
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2010 – 2019
- 2013
[j1]Haitham Eissa, Rami Fathy Salem, Ahmed Arafa, Sherif Hany
, Abdelrahman ElMously, Mohamed Dessouky, David Nairn, Mohab H. Anis:
Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow. IEEE Trans. Very Large Scale Integr. Syst. 21(5): 807-820 (2013)- 2012
- [c8]Rami F. Salem, Mohamed Al-Imam, Abdelrahman ElMously, Haitham Eissa, Ahmed Arafa, Mohab H. Anis:
High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. ISQED 2012: 223-227 - [c7]Ahmed Arafa, Hend Wagieh, Rami Fathy Salem, John Ferguson, Doug Morgan, Mohab H. Anis, Mohamed Dessouky:
Schematic-driven physical verification: Fully automated solution for analog IC design. SoCC 2012: 260-264 - 2011
- [c6]Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis:
An electrical-aware parametric DFM solution for analog circuits. IDT 2011: 68-73 - [c5]Ahmad Abdulghany, Rami Fathy Salem, Luigi Capodieci, Shobhit Malik:
Yield enhancement flow for analog and full custom designs reliability-rules automatic application. IDT 2011: 74-77 - [c4]Rami F. Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis:
A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. SoCC 2011: 231-236 - 2010
- [c3]Rami F. Salem, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, Mohab H. Anis:
A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs. IDT 2010: 13-17
2000 – 2009
- 2003
- [c2]Rami F. Salem, Mohamed S. Tawfik, Hani F. Ragaie:
A symmetric quadrature-less image rejection architecture for RF receivers. ISCAS (1) 2003: 313-316 - 2002
- [c1]Rami F. Salem, Sherif H. Galal, M. Sameh Tawfik, Hani F. Ragaie:
A new highly linear CMOS mixer suitable for deep submicron technologies. ICECS 2002: 81-84
Coauthor Index
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