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ORCIDMohamed Baker Alawieh
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Journal Articles
- 2021
[j6]Mohamed Baker Alawieh
, Yibo Lin, Zaiwei Zhang, Meng Li, Qixing Huang, David Z. Pan:
GAN-SRAF: Subresolution Assist Feature Generation Using Generative Adversarial Networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(2): 373-385 (2021)- 2020
- [j5]Jing Chen, Mohamed Baker Alawieh, Yibo Lin, Maolin Zhang, Jun Zhang, Yufeng Guo, David Z. Pan:
Powernet: SOI Lateral Power Device Breakdown Prediction With Deep Neural Networks. IEEE Access 8: 25372-25382 (2020) - 2018
- [j4]Minhee Jun, Rohit Negi, Shihui Yin, Mohamed Baker Alawieh, Fa Wang, Megha Sunny, Tamal Mukherjee, Xin Li:
Environment-Adaptable Fast Multi-Resolution (EAF-MR) optimization in large-scale RF-FPGA systems. EURASIP J. Wirel. Commun. Netw. 2018: 68 (2018) - [j3]Mohamed Baker Alawieh, Fa Wang, Xin Li:
Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 832-844 (2018) - [j2]Mohamed Baker Alawieh, Fa Wang, Xin Li:
Efficient Hierarchical Performance Modeling for Analog and Mixed-Signal Circuits via Bayesian Co-Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(12): 2986-2998 (2018) - 2017
- [j1]Weijing Shi, Mohamed Baker Alawieh, Xin Li, Huafeng Yu:
Algorithm and hardware implementation for visual perception system in autonomous vehicle: A survey. Integr. 59: 148-156 (2017)
Conference and Workshop Papers
- 2022
- [c18]Rachel Selina Rajarathnam, Mohamed Baker Alawieh, Zixuan Jiang, Mahesh A. Iyer, David Z. Pan:
DREAMPlaceFPGA: An Open-Source Analytical Placer for Large Scale Heterogeneous FPGAs using Deep-Learning Toolkit. ASP-DAC 2022: 300-306 - 2021
- [c17]Mohamed Baker Alawieh, David Z. Pan:
ADAPT: An Adaptive Machine Learning Framework with Application to Lithography Hotspot Detection. MLCAD 2021: 1-6 - 2020
- [c16]Mohamed Baker Alawieh, Wuxi Li, Yibo Lin, Love Singhal, Mahesh A. Iyer, David Z. Pan:
High-Definition Routing Congestion Prediction for Large-Scale FPGAs. ASP-DAC 2020: 26-31 - [c15]Mohamed Baker Alawieh, Duane S. Boning, David Z. Pan:
Wafer Map Defect Patterns Classification using Deep Selective Learning. DAC 2020: 1-6 - [c14]Mohamed Baker Alawieh, Wei Ye, David Z. Pan:
Re-examining VLSI Manufacturing and Yield through the Lens of Deep Learning : (Invited Talk). ICCAD 2020: 12:1-12:8 - [c13]Wei Ye, Mohamed Baker Alawieh, Yuki Watanabe, Shigeki Nojima, Yibo Lin, David Z. Pan:
TEMPO: Fast Mask Topography Effect Modeling with Deep Learning. ISPD 2020: 127-134 - 2019
- [c12]Wei Ye, Mohamed Baker Alawieh, Yibo Lin, David Z. Pan:
Tackling signal electromigration with learning-based detection and multistage mitigation. ASP-DAC 2019: 167-172 - [c11]Mohamed Baker Alawieh, Xiyuan Tang, David Z. Pan:
S2-PM: semi-supervised learning for efficient performance modeling of analog and mixed signal circuits. ASP-DAC 2019: 268-273 - [c10]Mohamed Baker Alawieh, Sinead A. Williamson, David Z. Pan:
Rethinking Sparsity in Performance Modeling for Analog and Mixed Circuits using Spike and Slab Models. DAC 2019: 65 - [c9]Wei Ye, Mohamed Baker Alawieh, Yibo Lin, David Z. Pan:
LithoGAN: End-to-End Lithography Modeling with Generative Adversarial Networks. DAC 2019: 107 - [c8]Mohamed Baker Alawieh, Yibo Lin, Zaiwei Zhang, Meng Li, Qixing Huang, David Z. Pan:
GAN-SRAF: Sub-Resolution Assist Feature Generation Using Conditional Generative Adversarial Networks. DAC 2019: 149 - [c7]Wei Ye, Mohamed Baker Alawieh, Meng Li, Yibo Lin, David Z. Pan:
Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection. DATE 2019: 54-59 - 2018
- [c6]Yibo Lin, Mohamed Baker Alawieh, Wei Ye, David Z. Pan:
Machine Learning for Yield Learning and Optimization. ITC 2018: 1-10 - 2017
- [c5]Mohamad Baker Alawieh, Fa Wang, Xin Li:
Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning. DAC 2017: 9:1-9:6 - [c4]Mohamed Baker Alawieh, Fa Wang, Jun Tao, Shihui Yin, Minhee Jun, Xin Li, Tamal Mukherjee, Rohit Negi:
Efficient programming of reconfigurable radio frequency (RF) systems. ICCAD 2017: 772-779 - 2016
- [c3]Weijing Shi, Mohamed Baker Alawieh, Xin Li, Huafeng Yu, Nikos Aréchiga, Nobuyuki Tomatsu:
Efficient statistical validation of machine learning systems for autonomous driving. ICCAD 2016: 36 - [c2]Mohamed Baker Alawieh, Fa Wang, Xin Li:
Identifying systematic spatial failure patterns through wafer clustering. ISCAS 2016: 910-913 - [c1]Mohamed Baker Alawieh, Fa Wang, Rouwaida Kanj, Xin Li, Rajiv V. Joshi:
Efficient analog circuit optimization using sparse regression and error margining. ISQED 2016: 410-415
Coauthor Index
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