default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDQ. Peter He
Person information
- affiliation: Auburn University, Department of Chemical Engineering, Auburn, AL, USA
- affiliation: Tuskegee University, Department of Chemical Engineering, Tuskegee, AL, USA
- affiliation (PhD 2005): University of Texas at Austin, TX, USA
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2022
[c16]Kiumars Badr, Q. Peter He, Jin Wang
:
Understanding the evolution of interspecies metabolic interactions using dynamic genome-scale metabolic modeling*. ACC 2022: 450-455- [c15]Alexander J. Summers, Houshang Yin, Ralf D. Fischer, Barton C. Prorok, Xiaoyuan Lou, Q. Peter He:
Improving Linear Separability of Pulse Wave Laser Additive Manufacturing Classifiers with Rational Feature Engineering and Selection *. ACC 2022: 2592-2597 - [c14]Jisung Jang, Di Tian, Q. Peter He:
Model-based Irrigation Control using Model Predictive Control and DSSAT Crop Simulator. ACC 2022: 5314-5319 - 2021
- [j7]Kerul Suthar, Q. Peter He:
Multiclass moisture classification in woodchips using IIoT Wi-Fi and machine learning techniques. Comput. Chem. Eng. 154: 107445 (2021) - 2020
- [j6]Devarshi Shah, Jin Wang, Q. Peter He:
Feature engineering in big data analytics for IoT-enabled smart manufacturing - Comparison between deep learning and statistical learning. Comput. Chem. Eng. 141: 106970 (2020) - [c13]Jangwon Lee, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He:
A Variable Selection Method for Improving Variable Selection Consistency and Soft Sensor Performance. ACC 2020: 725-730 - [c12]Kerul Suthar, Jin Wang, Zhihua Jiang, Q. Peter He:
Using Channel State Information for Estimating Moisture Content in Woodchips via 5 GHz Wi-Fi. ACC 2020: 2784-2789
2010 – 2019
- 2019
- [j5]Jangwon Lee, Q. Peter He:
Understanding the effect of specialization on hospital performance through knowledge-guided machine learning. Comput. Chem. Eng. 125: 490-498 (2019) - [j4]Q. Peter He, Jin Wang, Devarshi Shah:
Feature space monitoring for smart manufacturing via statistics pattern analysis. Comput. Chem. Eng. 126: 321-331 (2019) - [j3]Kerul Suthar, Devarshi Shah, Jin Wang, Q. Peter He:
Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework. Comput. Chem. Eng. 127: 140-149 (2019) - [j2]Feifan Cheng, Q. Peter He, Jinsong Zhao:
A novel process monitoring approach based on variational recurrent autoencoder. Comput. Chem. Eng. 129 (2019) - 2017
- [c11]Kyle A. Stone, Devarshi Shah, Q. Peter He, Jin Wang:
A new application of data-driven soft sensor: Estimating individual biomass in mixed cultures. ACC 2017: 561-566 - [c10]Q. Peter He, Jin Wang:
Statistical process monitoring in the era of smart manufacturing. ACC 2017: 4797-4802 - 2013
- [c9]Meng Liang, Q. Peter He, Thomas W. Jeffries, Jin Wang:
Elucidating xylose metabolism of scheffersomyces stipitis by integrating principal component analysis with flux balance analysis. ACC 2013: 3777-3782 - [c8]Q. Peter He, Jin Wang:
Quantification of valve stiction based on a semi-physical model. ACC 2013: 4362-4367 - [c7]Jin Wang, Q. Peter He, Thomas F. Edgar:
Improved state estimation for high-mix semiconductor manufacturing. ACC 2013: 6649-6654 - 2012
- [c6]Q. Peter He, Jin Wang, Hector E. Gilicia, John D. Stuber, Bhalinder S. Gill:
Statistics pattern analysis based virtual metrology for plasma etch processes. ACC 2012: 4897-4902 - 2010
- [c5]Q. Peter He, Jin Wang:
Comparison of a new spectrum alignment algorithm with other methods. ACC 2010: 1260-1265 - [c4]Jin Wang, Q. Peter He, Thomas F. Edgar:
Control performance assessment and diagnosis for semiconductor processes. ACC 2010: 7004-7009
2000 – 2009
- 2008
- [c3]Q. Peter He, Jin Wang:
Principal component based k-nearest-neighbor rule for semiconductor process fault detection. ACC 2008: 1606-1611 - [c2]Jin Wang, Q. Peter He:
EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis. ACC 2008: 2872-2877 - 2007
- [j1]Christopher A. Bode, Jin Wang, Q. Peter He, Thomas F. Edgar:
Run-to-run control and state estimation in high-mix semiconductor manufacturing. Annu. Rev. Control. 31(2): 241-253 (2007) - [c1]Jin Wang, Q. Peter He, Thomas F. Edgar:
A General Framework for State Estimation in High-Mix Semiconductor Manufacturing. ACC 2007: 3636-3641
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-07 22:06 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
