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2020 – today
- 2024
[j10]Qingkun Li, Lei Cao, Qingzhu Zhang, Lianlian Li, Xuexiang Zhang, Chuqiao Niu, Guanqiao Sang, Yunjiao Bao, Huaxiang Yin
, Zhenhua Wu:
Source/drain extension asymmetric counter-doping for suppressing channel leakage in stacked nanosheet transistors. Microelectron. J. 151: 106347 (2024)- [j9]Guangyu Lv, Xuan Li, Lei Fang, Yanbo Peng, Chuanxing Zhang, Jianyu Yao, Shilong Ren, Jinyue Chen, Jilin Men, Qingzhu Zhang, Guoqiang Wang, Qiao Wang:
Disentangling the Influential Factors Driving NPP Decrease in Shandong Province: An Analysis from Time Series Evaluation Using MODIS and CASA Model. Remote. Sens. 16(11): 1966 (2024) - 2023
- [j8]Zhaohao Zhang, Guohui Zhan, Weizhuo Gan, Yan Cheng, Xumeng Zhang, Yue Peng, Jianshi Tang, Fan Zhang, Jiali Huo, Gaobo Xu, Qingzhu Zhang, Zhenhua Wu, Yan Liu, Hangbing Lv, Qi Liu, Genquan Han, Huaxiang Yin, Jun Luo, Wenwu Wang:
Ultralow-Power Compact Artificial Synapse Based on a Ferroelectric Fin Field-Effect Transistor for Spatiotemporal Information Processing. Adv. Intell. Syst. 5(11) (2023) - [j7]Zhaohao Zhang, Guoliang Tian, Jiali Huo, Fang Zhang, Qingzhu Zhang, Gaobo Xu, Zhenhua Wu, Yan Cheng, Yan Liu, Huaxiang Yin:
Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications. Sci. China Inf. Sci. 66(10) (2023) - [j6]Peng Zhao, Lei Cao, Fan Zhang, Haoqing Xu, Weizhuo Gan, Qingzhu Zhang, Zhaohao Zhang, Jiaxin Yao, Guoliang Tian, Kun Luo, Zhenhua Wu, Huaxiang Yin:
Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors. Microelectron. J. 141: 105970 (2023) - 2022
- [j5]Hanwen Zhang, Baolin Xue, Guoqiang Wang, Xiaojing Zhang, Qingzhu Zhang:
Deep Learning-Based Water Quality Retrieval in an Impounded Lake Using Landsat 8 Imagery: An Application in Dongping Lake. Remote. Sens. 14(18): 4505 (2022) - [c3]Qingzhu Zhang, Tongtong Yuan:
Compound Label Learning for Affective Image Content Analysis. CICAI (1) 2022: 380-391 - 2021
- [j4]Jiali Huo, Weixing Huang, Fan Zhang, Shengli Zhang, Weizhuo Gan, Qiang Huo, Yuwei Cai, Qingzhu Zhang, Yongliang Li, Huilong Zhu, Huaxiang Yin, Zhenhua Wu:
Investigation on negative capacitance FinEFT beyond 7 nm node from device to circuit. Microelectron. J. 116: 105196 (2021) - [c2]Longda Zhou, Zhaohao Zhang, Hong Yang, Zhigang Ji, Qianqian Liu, Qingzhu Zhang, Eddy Simoen, Huaxiang Yin, Jun Luo, Anyan Du, Chao Zhao, Wenwu Wang:
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. IRPS 2021: 1-7 - 2020
- [c1]Longda Zhou, Qingzhu Zhang, Hong Yang, Zhigang Ji, Zhaohao Zhang, Renren Xu, Huaxiang Yin, Wenwu Wang:
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. IRPS 2020: 1-6
2010 – 2019
- 2018
- [j3]Bo Li, Yunbo Huang, Ling Yang, Qingzhu Zhang, Zhongshan Zheng, Binhong Li, Huiping Zhu, Jianhui Bu, Huaxiang Yin, Jiajun Luo, Zhengsheng Han, Haibin Wang:
Process variation dependence of total ionizing dose effects in bulk nFinFETs. Microelectron. Reliab. 88-90: 946-951 (2018) - [j2]Binhong Li, Yang Huang, Jianfei Wu, Yunbo Huang, Bo Li, Qingzhu Zhang, Ling Yang, Fayu Wan, Jiajun Luo, Zhengsheng Han, Huaxiang Yin:
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment. Microelectron. Reliab. 88-90: 969-973 (2018) - 2014
- [j1]Xuechao Guo, Alexey B. Nadykto, Yisheng Xu, Qingzhu Zhang, Jingtian Hu:
Ab intio Investigation of the Thermochemistry and Kinetics of the SO2 + O3- → SO3- + O2 Reaction in Aircraft Engines and the Environment. Entropy 16(12): 6300-6312 (2014)
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