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"Comparative Study on the Energy Profile of NBTI-Related Defects in Si and ..."

Longda Zhou et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129562

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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  - conf/irps/ZhouZYJZXYW20
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  - https://dblp.org/rec/conf/irps/ZhouZYJZXYW20
Longda Zhou, Qingzhu Zhang, Hong Yang, Zhigang Ji, Zhaohao Zhang, Renren Xu, Huaxiang Yin, Wenwu Wang:
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. IRPS 2020: 1-6

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