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"Area and Test Cost Reduction for On-Chip Wireless Test Channels with ..."
Chun-Kai Hsu et al. (2008)
- Chun-Kai Hsu, Li-Ming Denq, Mao-Yin Wang, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu:
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques. ATS 2008: 245-250
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