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J. L. Everaert

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Journal Articles

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2007
[j2]
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  dblp key:
  - journals/mr/RothschildMKSEDCRVVVLBDJNAB07
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  - https://dblp.org/rec/journals/mr/RothschildMKSEDCRVVVLBDJNAB07
A. Rothschild, R. Mitsuhashi, Christoph Kerner, X. Shi, J. L. Everaert, L. Date, Thierry Conard, Olivier Richard, C. Vrancken, R. Verbeeck, Anabela Veloso, A. Lauwers, Muriel de Potter de ten Broeck, I. Debusschere, M. Jurczak, M. Niwa, Philippe Absil, S. Biesemans:
Optimization of HfSiON using a design of experiment (DOE) approach on 0.45 V V_t Ni-FUSI CMOS transistors. Microelectron. Reliab. 47(4-5): 521-524 (2007)
2005
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  - journals/tim/BisschopEVEM05
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Frank De Bisschop, Sunny Eloot, Pascal R. Verdonck, J. L. Everaert, Marc De Mets:
Instrumental method for quantitative evaluation of cell or particle adhesion, based on transport measurements in capillary flow. IEEE Trans. Instrum. Meas. 54(5): 1891-1897 (2005)

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