M. K. Radhakrishnan

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with W. H. Lin

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Publications

2003
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Kin Leong Pey, C. H. Tung, M. K. Radhakrishnan, L. J. Tang, Y. Sun, X. D. Wang, W. H. Lin:
Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM. Microelectron. Reliab. 43(9-11): 1471-1476 (2003)
2002
[j1]
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  - journals/mr/RadhakrishnanPTL02
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  - https://dblp.org/rec/journals/mr/RadhakrishnanPTL02
M. K. Radhakrishnan, Kin Leong Pey, C. H. Tung, W. H. Lin:
Physical analysis of hard and soft breakdown failures in ultrathin gate oxides. Microelectron. Reliab. 42(4-5): 565-571 (2002)

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