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"Correlation of failure mechanism of constant-current-stress and ..."
Kin Leong Pey et al. (2003)
- Kin Leong Pey, C. H. Tung, M. K. Radhakrishnan, L. J. Tang, Y. Sun, X. D. Wang, W. H. Lin:
Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM. Microelectron. Reliab. 43(9-11): 1471-1476 (2003)
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