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Thomas P. Warwick

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2000 – 2009

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2008
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Thomas P. Warwick, Gustavo Rivera, David Waite, James Russell, Jeffrey Smith:
Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications. ITC 2008: 1-10
2003
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Thomas P. Warwick:
Mitigating the Effects of The DUT Interface board and Test System Parasitics in Gigabit-Plus Measurements. ITC 2003: 537-544
2002
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Thomas P. Warwick:
What a Device Interface Board Really Costs: An Evaluation of Technical Considerations for Testing Products Operating in the Gigabit Region. ITC 2002: 555-564

1990 – 1999

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1999
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Clifford B. Cole, Thomas P. Warwick:
High speed digital transceivers: A challenge for manufacturing. ITC 1999: 211-215
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Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner:
An accurate simulation model of the ATE test environment for very high speed devices. ITC 1999: 524-531

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