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"Measurement Repeatability for RF Test Within the Load-board Constraints of ..."

Thomas P. Warwick et al. (2008)

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DOI: 10.1109/TEST.2008.4700570

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/itc/WarwickRWRS08
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  - https://dblp.org/rec/conf/itc/WarwickRWRS08
Thomas P. Warwick, Gustavo Rivera, David Waite, James Russell, Jeffrey Smith:
Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications. ITC 2008: 1-10

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