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Yun-Pan Ho

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1990 – 1999

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1997
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Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das:
Delay Fault Coverage Enhancement Using Variable Observation Times. J. Electron. Test. 11(2): 131-146 (1997)
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Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das:
Delay Fault Coverage Enhancement Using Multiple Test Observation Times. VLSI Design 1997: 106-110

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