Robert Jérisian

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Stéphane Forster

> Home > Persons > Robert Jérisian

Publications

2003
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/ForsterLJ03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ForsterLJ03
Stéphane Forster, Thierry Lequeu, Robert Jérisian:
Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3. Microelectron. Reliab. 43(1): 89-98 (2003)
2002
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/MoreauFLJ02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MoreauFLJ02
Stéphane Moreau, Stéphane Forster, Thierry Lequeu, Robert Jérisian:
Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal fatigue study in Q1 compared to Q2. Microelectron. Reliab. 42(9-11): 1663-1666 (2002)
2001
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/ForsterLJ01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ForsterLJ01
Stéphane Forster, Thierry Lequeu, Robert Jérisian:
Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects. Microelectron. Reliab. 41(9-10): 1677-1682 (2001)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.