"Operation of power semiconductors under transient thermal conditions: ..."

Stéphane Forster, Thierry Lequeu, Robert Jérisian (2001)

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DOI: 10.1016/S0026-2714(01)00185-8

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type: Journal Article

metadata version: 2020-02-22

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Stéphane Forster, Thierry Lequeu, Robert Jérisian:
Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects. Microelectron. Reliab. 41(9-10): 1677-1682 (2001)

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