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ORCIDPeter Sandborn
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- affiliation: University of Maryland, College Park, USA
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2020 – today
- 2023
[i1]Ray Islam, Peter Sandborn:
Demonstration of a Response Time Based Remaining Useful Life (RUL) Prediction for Software Systems. CoRR abs/2307.12237 (2023)- 2022
- [b1]Peter Sandborn, William Lucyshyn:
System Sustainment - Acquisition and Engineering Processes for the Sustainment of Critical and Legacy Systems. World Scientific Series on Emerging Technologies 4, WorldScientific 2022, ISBN 9789811256844, pp. 1-388
2010 – 2019
- 2015
- [j19]Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht
, Winco K. C. Yung, Wenbin Wang:
A return on investment analysis of applying health monitoring to LED lighting systems. Microelectron. Reliab. 55(3-4): 527-537 (2015) - [j18]Edwin Lillie, Peter Sandborn, David Humphrey:
Assessing the value of a lead-free solder control plan using cost-based FMEA. Microelectron. Reliab. 55(6): 969-979 (2015) - [j17]Peter A. Sandborn, Varun J. Prabhakar:
The Forecasting and Impact of the Loss of Critical Human Skills Necessary for Supporting Legacy Systems. IEEE Trans. Engineering Management 62(3): 361-371 (2015) - [c4]Xin Lei, Peter Sandborn, Roozbeh Bakhshi, Amir Kashani-Pour, Navid Goudarzi:
PHM based predictive maintenance optimization for offshore wind farms. ICPHM 2015: 1-8 - 2013
- [j16]Liyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn:
Ontology-Based Knowledge Representation for Obsolescence Forecasting. J. Comput. Inf. Sci. Eng. 13(1) (2013) - 2012
- [j15]Varun J. Prabhakar, Peter Sandborn:
A part total cost of ownership model for long life cycle electronic systems. Int. J. Comput. Integr. Manuf. 25(4-5): 384-397 (2012) - [j14]Gilbert Haddad, Peter A. Sandborn, Michael G. Pecht:
An Options Approach for Decision Support of Systems With Prognostic Capabilities. IEEE Trans. Reliab. 61(4): 872-883 (2012) - 2011
- [j13]Peter Sandborn, Varun J. Prabhakar, O. Ahmad:
Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescence. Microelectron. Reliab. 51(2): 392-399 (2011)
2000 – 2009
- 2009
- [j12]Kiri Feldman, Taoufik Jazouli, Peter Sandborn:
A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management. IEEE Trans. Reliab. 58(2): 305-316 (2009) - 2007
- [j11]Peter Sandborn, Michael G. Pecht:
Introduction to special section on electronic systems prognostics and health management. Microelectron. Reliab. 47(12): 1847-1848 (2007) - [j10]E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher:
Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. Microelectron. Reliab. 47(12): 1857-1864 (2007) - [j9]Peter A. Sandborn, Chris Wilkinson:
A maintenance planning and business case development model for the application of prognostics and health management (PHM) to electronic systems. Microelectron. Reliab. 47(12): 1889-1901 (2007) - 2006
- [j8]Zhen Shi, Peter Sandborn:
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. J. Electron. Test. 22(1): 49-60 (2006) - 2005
- [j7]Andre Kleyner, Peter Sandborn:
A warranty forecasting model based on piecewise statistical distributions and stochastic simulation. Reliab. Eng. Syst. Saf. 88(3): 207-214 (2005) - 2003
- [c3]Zhen Shi, Peter Sandborn:
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. ITC 2003: 937-946 - 2002
- [c2]Daniel Ragan, Peter Sandborn, Paul Stoaks:
A detailed cost model for concurrent use with hardware/software co-design. DAC 2002: 269-274 - 2001
- [j6]Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht:
Process capability indices and product reliability. Microelectron. Reliab. 41(12): 2067-2070 (2001) - [c1]Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe:
A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly. ITC 2001: 1108-1117
1990 – 1999
- 1998
- [j5]Peter Sandborn, Mike Vertal:
Analyzing Packaging Trade-Offs During System Design. IEEE Des. Test Comput. 15(3): 10-19 (1998) - 1997
- [j4]Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn:
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. J. Electron. Test. 10(1-2): 151-166 (1997) - 1994
- [j3]Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake:
Analyzing Multichip Module Testing Strategies. IEEE Des. Test Comput. 11(1): 40-52 (1994) - [j2]Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy:
High Level Test Economics Advisor (Hi-TEA). J. Electron. Test. 5(2-3): 195-206 (1994) - [j1]Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh:
Multichip systems trade-off analysis tool. J. Electron. Test. 5(2-3): 207-218 (1994)
Coauthor Index
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