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Chris Wilkerson
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Publications
- 2011
- [j8]Arijit Raychowdhury, Jim Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De:
Error Detection and Correction in Microprocessor Core and Memory Due to Fast Dynamic Voltage Droops. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(3): 208-217 (2011) - [j7]Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek K. De:
A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance. IEEE J. Solid State Circuits 46(1): 194-208 (2011) - 2010
- [c19]James W. Tschanz, Keith A. Bowman, Muhammad M. Khellah, Chris Wilkerson, Bibiche M. Geuskens, Dinesh Somasekhar, Arijit Raychowdhury, Jaydeep Kulkarni, Carlos Tokunaga, Shih-Lien Lu, Tanay Karnik, Vivek De:
Resilient design in scaled CMOS for energy efficiency. ASP-DAC 2010: 625 - [c17]Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De:
Resilient microprocessor design for high performance & energy efficiency. ISLPED 2010: 355-356 - [c16]James W. Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De:
A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance. ISSCC 2010: 282-283 - 2009
- [j5]Keith A. Bowman, James W. Tschanz, Nam-Sung Kim, Janice C. Lee, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek K. De:
Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance. IEEE J. Solid State Circuits 44(1): 49-63 (2009) - [j3]Keith A. Bowman, Alaa R. Alameldeen, Srikanth T. Srinivasan, Chris Wilkerson:
Impact of Die-to-Die and Within-Die Parameter Variations on the Clock Frequency and Throughput of Multi-Core Processors. IEEE Trans. Very Large Scale Integr. Syst. 17(12): 1679-1690 (2009) - [c15]Keith A. Bowman, James W. Tschanz, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek De, Shekhar Y. Borkar:
Circuit techniques for dynamic variation tolerance. DAC 2009: 4-7 - [c14]James W. Tschanz, Keith A. Bowman, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik:
Resilient circuits - Enabling energy-efficient performance and reliability. ICCAD 2009: 71-73 - 2008
- [c10]Keith A. Bowman, James W. Tschanz, Nam-Sung Kim, Janice C. Lee, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek K. De:
Energy-Efficient and Metastability-Immune Timing-Error Detection and Instruction-Replay-Based Recovery Circuits for Dynamic-Variation Tolerance. ISSCC 2008: 402-403 - 2007
- [c9]Keith A. Bowman, Alaa R. Alameldeen, Srikanth T. Srinivasan, Chris Wilkerson:
Impact of die-to-die and within-die parameter variations on the throughput distribution of multi-core processors. ISLPED 2007: 50-55
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