Matthias Beck

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Frank Poehl

> Home > Persons > Matthias Beck

Publications

2007
[j24]
- view
  authority control:
- export record
  dblp key:
  - journals/iet-cdt/PoehlBARRG07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cdt/PoehlBARRG07
Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel:
On-chip evaluation, compensation and storage of scan diagnosis data. IET Comput. Digit. Tech. 1(3): 207-212 (2007)
[i1]
- view
  - electronic edition @ arxiv.org (open access)
  - references & citations
- export record
  dblp key:
  - journals/corr/abs-0710-4763
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-0710-4763
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press:
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. CoRR abs/0710.4763 (2007)
2006
[c5]
- view
  authority control:
- export record
  dblp key:
  - conf/ets/PoehlRBGAO06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/PoehlRBGAO06
Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz:
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. ETS 2006: 239-246
2005
[c4]
- view
  authority control:
- export record
  dblp key:
  - conf/date/BeckBKPLP05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/BeckBKPLP05
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press:
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61
[c3]
- view
  authority control:
- export record
  dblp key:
  - conf/vts/BeckBPLP05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/BeckBPLP05
Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press:
Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228
2003
[c2]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/PoehlBAMTKMR03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/PoehlBAMTKMR03
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski:
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.